JPH01178872U - - Google Patents
Info
- Publication number
- JPH01178872U JPH01178872U JP7461988U JP7461988U JPH01178872U JP H01178872 U JPH01178872 U JP H01178872U JP 7461988 U JP7461988 U JP 7461988U JP 7461988 U JP7461988 U JP 7461988U JP H01178872 U JPH01178872 U JP H01178872U
- Authority
- JP
- Japan
- Prior art keywords
- water
- receiver
- pipe
- side wall
- collection portion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 10
- 238000009423 ventilation Methods 0.000 claims description 2
Landscapes
- Washing And Drying Of Tableware (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7461988U JPH01178872U (en]) | 1988-06-04 | 1988-06-04 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7461988U JPH01178872U (en]) | 1988-06-04 | 1988-06-04 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01178872U true JPH01178872U (en]) | 1989-12-21 |
Family
ID=31299724
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7461988U Pending JPH01178872U (en]) | 1988-06-04 | 1988-06-04 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01178872U (en]) |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7138810B2 (en) | 2002-11-08 | 2006-11-21 | Cascade Microtech, Inc. | Probe station with low noise characteristics |
US7138813B2 (en) | 1999-06-30 | 2006-11-21 | Cascade Microtech, Inc. | Probe station thermal chuck with shielding for capacitive current |
US7164279B2 (en) | 1995-04-14 | 2007-01-16 | Cascade Microtech, Inc. | System for evaluating probing networks |
US7176705B2 (en) | 2004-06-07 | 2007-02-13 | Cascade Microtech, Inc. | Thermal optical chuck |
US7187188B2 (en) | 2003-12-24 | 2007-03-06 | Cascade Microtech, Inc. | Chuck with integrated wafer support |
US7190181B2 (en) | 1997-06-06 | 2007-03-13 | Cascade Microtech, Inc. | Probe station having multiple enclosures |
US7221172B2 (en) | 2003-05-06 | 2007-05-22 | Cascade Microtech, Inc. | Switched suspended conductor and connection |
US7221146B2 (en) | 2002-12-13 | 2007-05-22 | Cascade Microtech, Inc. | Guarded tub enclosure |
US7250626B2 (en) | 2003-10-22 | 2007-07-31 | Cascade Microtech, Inc. | Probe testing structure |
US7250779B2 (en) | 2002-11-25 | 2007-07-31 | Cascade Microtech, Inc. | Probe station with low inductance path |
US7268533B2 (en) | 2001-08-31 | 2007-09-11 | Cascade Microtech, Inc. | Optical testing device |
-
1988
- 1988-06-04 JP JP7461988U patent/JPH01178872U/ja active Pending
Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7164279B2 (en) | 1995-04-14 | 2007-01-16 | Cascade Microtech, Inc. | System for evaluating probing networks |
US7190181B2 (en) | 1997-06-06 | 2007-03-13 | Cascade Microtech, Inc. | Probe station having multiple enclosures |
US7138813B2 (en) | 1999-06-30 | 2006-11-21 | Cascade Microtech, Inc. | Probe station thermal chuck with shielding for capacitive current |
US7292057B2 (en) | 1999-06-30 | 2007-11-06 | Cascade Microtech, Inc. | Probe station thermal chuck with shielding for capacitive current |
US7268533B2 (en) | 2001-08-31 | 2007-09-11 | Cascade Microtech, Inc. | Optical testing device |
US7295025B2 (en) | 2002-11-08 | 2007-11-13 | Cascade Microtech, Inc. | Probe station with low noise characteristics |
US7138810B2 (en) | 2002-11-08 | 2006-11-21 | Cascade Microtech, Inc. | Probe station with low noise characteristics |
US7250779B2 (en) | 2002-11-25 | 2007-07-31 | Cascade Microtech, Inc. | Probe station with low inductance path |
US7221146B2 (en) | 2002-12-13 | 2007-05-22 | Cascade Microtech, Inc. | Guarded tub enclosure |
US7221172B2 (en) | 2003-05-06 | 2007-05-22 | Cascade Microtech, Inc. | Switched suspended conductor and connection |
US7250626B2 (en) | 2003-10-22 | 2007-07-31 | Cascade Microtech, Inc. | Probe testing structure |
US7187188B2 (en) | 2003-12-24 | 2007-03-06 | Cascade Microtech, Inc. | Chuck with integrated wafer support |
US7176705B2 (en) | 2004-06-07 | 2007-02-13 | Cascade Microtech, Inc. | Thermal optical chuck |