JPH01178872U - - Google Patents

Info

Publication number
JPH01178872U
JPH01178872U JP7461988U JP7461988U JPH01178872U JP H01178872 U JPH01178872 U JP H01178872U JP 7461988 U JP7461988 U JP 7461988U JP 7461988 U JP7461988 U JP 7461988U JP H01178872 U JPH01178872 U JP H01178872U
Authority
JP
Japan
Prior art keywords
water
receiver
pipe
side wall
collection portion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7461988U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7461988U priority Critical patent/JPH01178872U/ja
Publication of JPH01178872U publication Critical patent/JPH01178872U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Washing And Drying Of Tableware (AREA)
JP7461988U 1988-06-04 1988-06-04 Pending JPH01178872U (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7461988U JPH01178872U (en]) 1988-06-04 1988-06-04

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7461988U JPH01178872U (en]) 1988-06-04 1988-06-04

Publications (1)

Publication Number Publication Date
JPH01178872U true JPH01178872U (en]) 1989-12-21

Family

ID=31299724

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7461988U Pending JPH01178872U (en]) 1988-06-04 1988-06-04

Country Status (1)

Country Link
JP (1) JPH01178872U (en])

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7138810B2 (en) 2002-11-08 2006-11-21 Cascade Microtech, Inc. Probe station with low noise characteristics
US7138813B2 (en) 1999-06-30 2006-11-21 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US7164279B2 (en) 1995-04-14 2007-01-16 Cascade Microtech, Inc. System for evaluating probing networks
US7176705B2 (en) 2004-06-07 2007-02-13 Cascade Microtech, Inc. Thermal optical chuck
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
US7190181B2 (en) 1997-06-06 2007-03-13 Cascade Microtech, Inc. Probe station having multiple enclosures
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7221146B2 (en) 2002-12-13 2007-05-22 Cascade Microtech, Inc. Guarded tub enclosure
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US7268533B2 (en) 2001-08-31 2007-09-11 Cascade Microtech, Inc. Optical testing device

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7164279B2 (en) 1995-04-14 2007-01-16 Cascade Microtech, Inc. System for evaluating probing networks
US7190181B2 (en) 1997-06-06 2007-03-13 Cascade Microtech, Inc. Probe station having multiple enclosures
US7138813B2 (en) 1999-06-30 2006-11-21 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US7292057B2 (en) 1999-06-30 2007-11-06 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US7268533B2 (en) 2001-08-31 2007-09-11 Cascade Microtech, Inc. Optical testing device
US7295025B2 (en) 2002-11-08 2007-11-13 Cascade Microtech, Inc. Probe station with low noise characteristics
US7138810B2 (en) 2002-11-08 2006-11-21 Cascade Microtech, Inc. Probe station with low noise characteristics
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US7221146B2 (en) 2002-12-13 2007-05-22 Cascade Microtech, Inc. Guarded tub enclosure
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
US7176705B2 (en) 2004-06-07 2007-02-13 Cascade Microtech, Inc. Thermal optical chuck

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